Grain Boundary Analysis in Superplastic SiO2 - Doped TZP

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Periodical:

Materials Science Forum (Volumes 233-234)

Edited by:

T. Sakuma, T. Aizawa and K. Higashi

Pages:

367-374

Citation:

P. Thavorniti et al., "Grain Boundary Analysis in Superplastic SiO2 - Doped TZP", Materials Science Forum, Vols. 233-234, pp. 367-374, 1997

Online since:

October 1996

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Price:

$38.00

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