Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

1359-1362

DOI:

10.4028/www.scientific.net/MSF.264-268.1359

Citation:

Z. C. Feng et al., "Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope", Materials Science Forum, Vols. 264-268, pp. 1359-1362, 1998

Online since:

February 1998

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