Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 287-288)

Edited by:

Horst Hoffmann

Pages:

23-60

DOI:

10.4028/www.scientific.net/MSF.287-288.23

Citation:

R. A. Schwarzer "Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction", Materials Science Forum, Vols. 287-288, pp. 23-60, 1998

Online since:

August 1998

Export:

Price:

$35.00

In order to see related information, you need to Login.