Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction

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Periodical:

Materials Science Forum (Volumes 287-288)

Edited by:

Horst Hoffmann

Pages:

23-60

Citation:

R. A. Schwarzer "Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction", Materials Science Forum, Vols. 287-288, pp. 23-60, 1998

Online since:

August 1998

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$38.00

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