Spatially Modulated Advanced X-Ray Optics
p.174
p.174
Application of Ni/C Göbel Mirrors
p.179
p.179
Effect of Ion-Beam Polishing on the Interface Quality in a Ti/C Multilayer Mirror for 'Water Window'
p.184
p.184
Handling of Unusual Instrumental Profiles by the BGMN Rietveld Program
p.192
p.192
A Rietveld-Analysis Programm RIETAN-98 and its Applications to Zeolites
p.198
p.198
A New High Precision Strain Scanner at the ILL
p.206
p.206
A Versatile Diffraction Instrument on Station 2.3 of the Daresbury Laboratory
p.212
p.212
High Energy Synchrotron X-Ray Measurements of 2D Residual Stress States in Metal Matrix Composites
p.218
p.218
Crystallisation Kinetics and Phase Relations of Wollastonite by Real Time Synchrotron Powder Diffraction
p.224
p.224
A Rietveld-Analysis Programm RIETAN-98 and its Applications to Zeolites
Abstract:
Info:
Periodical:
Materials Science Forum (Volumes 321-324)
Edited by:
R. Delhez, E.J. Mittemeijer
Pages:
198-205
Citation:
Online since:
January 2000
Authors:
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