Deconvolution of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study of Polycrystalline 9-YSZ

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Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

18-23

Citation:

F. Sánchez-Bajo et al., "Deconvolution of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study of Polycrystalline 9-YSZ", Materials Science Forum, Vols. 378-381, pp. 18-23, 2001

Online since:

October 2001

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$38.00

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