Fundamental Parameters Versus Learnt Profiles Using the Rietveld Program BGMN

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

30-37

DOI:

10.4028/www.scientific.net/MSF.378-381.30

Citation:

J. Bergmann and R. Kleeberg, "Fundamental Parameters Versus Learnt Profiles Using the Rietveld Program BGMN", Materials Science Forum, Vols. 378-381, pp. 30-37, 2001

Online since:

October 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.