Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

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Periodical:

Materials Science Forum (Volumes 389-393)

Edited by:

S. Yoshida, S. Nishino, H. Harima and T. Kimoto

Pages:

427-430

DOI:

10.4028/www.scientific.net/MSF.389-393.427

Citation:

R. E. Stahlbush et al., "Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes", Materials Science Forum, Vols. 389-393, pp. 427-430, 2002

Online since:

April 2002

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