Global X-Ray Method for the Determination of Stress Profiles

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Periodical:

Materials Science Forum (Volumes 404-407)

Edited by:

A.M. Dias, J. Pina, A.C. Batista and E. Diogo

Pages:

19-24

DOI:

10.4028/www.scientific.net/MSF.404-407.19

Citation:

J. M. Sprauel and H. Michaud, "Global X-Ray Method for the Determination of Stress Profiles", Materials Science Forum, Vols. 404-407, pp. 19-24, 2002

Online since:

August 2002

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$35.00

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