Texture Analysis of Ferroelectric Thin Films on Platinised Si-Based Substrates with a TiO2 Layer

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Periodical:

Materials Science Forum (Volumes 408-412)

Edited by:

Dong Nyung Lee

Pages:

1543-1548

DOI:

10.4028/www.scientific.net/MSF.408-412.1543

Citation:

J. Ricote et al., "Texture Analysis of Ferroelectric Thin Films on Platinised Si-Based Substrates with a TiO2 Layer", Materials Science Forum, Vols. 408-412, pp. 1543-1548, 2002

Online since:

August 2002

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$35.00

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