Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis

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Periodical:

Materials Science Forum (Volumes 414-415)

Edited by:

J. Gyulai

Pages:

229-234

DOI:

10.4028/www.scientific.net/MSF.414-415.229

Citation:

J. Gubicza et al., "Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis", Materials Science Forum, Vols. 414-415, pp. 229-234, 2003

Online since:

January 2003

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$35.00

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