Orientation-Dependent Defect Formation in Silicon Carbide Epitaxial Layers


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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén




R. Yakimova et al., "Orientation-Dependent Defect Formation in Silicon Carbide Epitaxial Layers", Materials Science Forum, Vols. 433-436, pp. 281-284, 2003

Online since:

September 2003




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