EPR Studies of Interface Defects in n-Type 6H-SiC/SiO2 Using Porous SiC

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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

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495-498

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H. J. von Bardeleben et al., "EPR Studies of Interface Defects in n-Type 6H-SiC/SiO2 Using Porous SiC", Materials Science Forum, Vols. 433-436, pp. 495-498, 2003

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September 2003

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DOI: https://doi.org/10.1016/s0040-6090(96)09244-9

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