High-Sensitivity Ion Beam Analytical Method for Studying Ion-Implanted SiC


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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén






G. Battistig et al., "High-Sensitivity Ion Beam Analytical Method for Studying Ion-Implanted SiC", Materials Science Forum, Vols. 433-436, pp. 625-628, 2003

Online since:

September 2003




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