Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

677-680

Citation:

N. Tanuma et al., "Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN", Materials Science Forum, Vols. 433-436, pp. 677-680, 2003

Online since:

September 2003

Export:

Price:

$38.00

[1] L. Eastman, U.K. Mishra: IEEE Spectrum, May (2002) 28.

[2] N. Tanuma, S. Yasukawa, S. Yokokura, S. Hashiguchi, J. Sikula, T. Mastui and M. Tacano: Jpn. J. Appl. Phys. 40 (2001) 3979.

[3] A. Balandin, S. Morozov, G. Wijeratne, S. J. Cai, R. Li, J. Li, K. L. Wang, C. R. Viswanathan, Yu. Dubrovskii: Appl. Phys. Letts. 75 (1999) (2064).

[4] M. E. Levinshtein, S. L. Rumyantsev, D. C. Look, R. J. Molnar, M. Asif Khan, G. Simin, V. Adivarahan, M. S. Shur: J. Appl. Phys. 86 (1999) 5075.

[5] S. Rumyantsev, M. E. Levinshtein, R. Gaska, M. S. Shur, J. W. Yang, M. A. Khan: J. Appl. Phys. 87 (2000) 1849.

[6] N. Pala, S. L. Rumyantsev, M. S. Shur, X. Hu, A. Tarakji, R. Gaska, M. Asif Khan, G. Simin, J. Yang: Solid State Electronics 46 (2002) 711.

DOI: https://doi.org/10.1016/s0038-1101(01)00302-1

[7] S. L. Rumyantsev, N. Pala, M. S. Shur, R. Gaska, M. E. Levinshtein, M. Asif Khan, G. Simin, X. Hu, J. Yang: Electronics Letts. 37 (2001) 720.

DOI: https://doi.org/10.1049/el:20010982

[8] M. Tacano, Y. Sugiyama: 11th European Passive Components Symposium (1997) 67.

[9] M. Tacano, Y. Sugiyama, K. Oka: 3rd FED Workshop on High Temperature Superconductivity Electron Device (1991) 134.

[10] N. Tanuma, H. Tanoue, H. Tanizaki, S. Yokokura, T. Matsui, M. Tacano: 9th van der Ziel Symposium on Quantum 1/f Noise and Other low Frequency Fluctuations, 2002 (VCU, Sept., 2002) to be published.

[11] M. Tacano, Y. Sugiyama: Solid-St. Electronics 34 (1988) 1049.

Fetching data from Crossref.
This may take some time to load.