Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN


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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén




N. Tanuma et al., "Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN", Materials Science Forum, Vols. 433-436, pp. 677-680, 2003

Online since:

September 2003




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