Grain Surface Relaxation and Grain Interaction in Powder Diffraction


Article Preview

The role of grain surfaces and interfaces in nanocrystalline materials is investigated by X-ray diffraction (XRD). Two apparently distinct aspects show the importance of the interaction of a single grain with the environment in which it is placed: the role of grain-grain interaction in determining the residual stress in a polycrystalline thin film and the surface effects in single powder grains on the macroscopic average cell parameter determined by powder diffraction. A brief theoretical introduction of the phenomena and their possible modelling is presented together with a discussion of practical examples.



Materials Science Forum (Volumes 443-444)

Edited by:

Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel




M. Leoni "Grain Surface Relaxation and Grain Interaction in Powder Diffraction", Materials Science Forum, Vols. 443-444, pp. 1-10, 2004

Online since:

January 2004





[1] R.Z. Valiev, R.K. Islamgaliev, I.V. Alexandrov, Progr. Mater. Sci. 45 (2000) 103.

[2] van Leeuwen M., Kamminga J. -D., Mittemeijer E.J., J. Appl. Phys. 86.

[4] (1999) (1904).

[3] Leoni M., Welzel U., Lamparter P., Mittemeijer E.J., Kamminga J. -D., Phil. Mag. A 81 (2001) 597.

[4] Bunge H. -J. Texture analysis in materials science, (1982) London: Butterworths.

[5] Hauk, V. (editor), Structural and residual stress analysis by nondestructive methods, (1997) Amsterdam: Elsevier.

[6] Voigt W., Lehrbuch der Kristallphysik, (1910) Leipzig-Berlin: Teubner.

[7] Reuss A., Zeitschrift für angewandte Mathematik und Mechanik, 9 (1929) 49.

[8] Vook R.W., Witt F., J. Appl. Phys. 36.

[7] (1965) 2169.

[9] Welzel U., Leoni M., Mittemeijer E.J., Phil. Mag. A. (2002) Submitted.

[10] Hill R., Proc. Phys. Soc. London 65 (1952) 349.

[11] Leoni M., Scardi P., Proceeedings of the Size Strain III Conference, Scardi P., Leoni M., Mittemeijer E.J. eds. (2001) Trento (Italy).

[12] Leoni M., Scardi P. (2002). To be submitted to J. Appl. Cryst.

[13] Warren B.E. X-ray diffraction, 2nd edition (1990) New York: Dover (1 st edition (1969), Reading, Mass.: Addison Wesley).

[14] Scardi P., Leoni M., Acta Cryst. A58 (2002) 190.

[15] Cheary R.W., Coelho A.A., J. Appl. Cryst. 25 (1992) 109.

[16] Young R.A., (editor), The Rietveld Method, (1993) Oxford: Oxford University Press.

[17] Scardi P., Leoni M., Dong Y.H., Eur. Phys. J. B 18 (2000) 23.

[18] JCPDS card #34-0394.

[19] Audebrand N., Auffrédic J.P., Louër D., Chem. Mater. 12 (2000) 1791.

[20] Wu Z., Guo L., Li H., Yang Q., Li Q., Zhu H., Mat. Sci. Eng. A286 (2000) 179.

Fetching data from Crossref.
This may take some time to load.