Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties

Abstract:

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A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.

Info:

Periodical:

Materials Science Forum (Volumes 443-444)

Edited by:

Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel

Pages:

123-126

DOI:

10.4028/www.scientific.net/MSF.443-444.123

Citation:

J. Rodríquez-Carvajal and T. Roisnel , "Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties", Materials Science Forum, Vols. 443-444, pp. 123-126, 2004

Online since:

January 2004

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Price:

$35.00

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