Characterization of Crystalline Silicon via XRPD

Abstract:

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Three blocks of silicon have been crashed in this experiment in order to verify the crashing effects on specimens having distinct original micro-structural arrangements. One of them comes from a rod bar of mono-crystal silicon, two others were from polycrystalline silicon manufactured by two distinct manufacturers with distinct growing process. Several specimens of powders, differing in type and grain size, were obtained by treating these source samples. This paper reports on data collected from synchrotron and conventional radiation and the results show that powders obtained from mono-crystalline silicon provide diffraction profiles, where the structural contribution is smaller than for polycrystalline silicon specimens. The peaks from the 'mono-crystal powder' resulted even narrower than peaks from SRM Silicon 640b by NIST.

Info:

Periodical:

Materials Science Forum (Volumes 443-444)

Edited by:

Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel

Pages:

83-86

DOI:

10.4028/www.scientific.net/MSF.443-444.83

Citation:

G. Berti et al., "Characterization of Crystalline Silicon via XRPD", Materials Science Forum, Vols. 443-444, pp. 83-86, 2004

Online since:

January 2004

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Price:

$35.00

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