Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments — How to Avoid Ghost Stresses?
On evaluating lattice strain-depth or stress-depth profiles with X-ray diffraction, the variation of the information depth while combining various tilt angles, in combination with lattice spacing gradients leads to artefacts, so-called ghost or fictitious stresses. X-ray diffraction lattice-strain analysis was simulated for a model stress-depth profile combined with a composition-depth profile. Two principally different methods were investigated for the reconstruction of the actual stress and composition profiles from the simulated data: - considering the stress/strain determined at a specific depth as a weighted average over the actual stress/strain depth profile - considering the lattice spacing determined at a specific depth, for a specific value for as a weighted average over the actual lattice spacing profile for this direction. On the basis of the results it is possible to propose a preferred method for the evaluation of stress/strain and composition profiles, while minimising the risk for ghost stresses.
Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel
T. L. Christiansen and M. A.J. Somers, "Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments — How to Avoid Ghost Stresses?", Materials Science Forum, Vols. 443-444, pp. 91-94, 2004