Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

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Periodical:

Materials Science Forum (Volumes 445-446)

Edited by:

Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito

Pages:

510-512

DOI:

10.4028/www.scientific.net/MSF.445-446.510

Citation:

T.E.M. Staab et al., "Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe", Materials Science Forum, Vols. 445-446, pp. 510-512, 2004

Online since:

January 2004

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