In-Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films


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Materials Science Forum (Volumes 455-456)

Edited by:

Rodrigo Martins, Elvira Fortunator, Isabel Ferreira, Carlos Dias




R. M. S. Martins et al., "In-Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films", Materials Science Forum, Vols. 455-456, pp. 342-345, 2004

Online since:

May 2004




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