Investigation of Rapid Thermal Annealed pn-Junctions in SiC

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1073-1076

Citation:

M. Rambach et al., "Investigation of Rapid Thermal Annealed pn-Junctions in SiC", Materials Science Forum, Vols. 457-460, pp. 1073-1076, 2004

Online since:

June 2004

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[1] H. Wirth, D. Pankin, W. Skorupa, and E. Niemann: Appl. Phys. Lett. Vol. 74 (7) (1999), p.979.

[2] H. Nakamura, H. Watanabe, J. Yamazaki, N. Tanaka, and R.K. Malhan: Mat. Sci. Forum Vol. 389-393 (2001), p.807.

[3] J.A. Powell, and D. J. Larkin: phys. stat. sol. (b) Vol. 202 (1997), p.529.

[4] R. Stief: PhD. Thesis, University of Erlangen-Nuremberg (1999).

[5] V. Heera, D. Pankin, and W. Skorupa: Appl. Surf. Science Vol. 184 (2001), p.307.

[6] W. Bahng, G.H. Song, N.K. Kim, K.S. Seo, H.W. Kim, and E.D. Kim: Mat. Sci. Forum Vol. 433-436 (2003), p.617.

[7] M.A. Capano, S. Ryu, J.A. Cooper JR, M.R. Melloch, K. Rottner, S. Karlsson, N. Nordell, A. Powell, and D.E. Walker JR: Journal of Elec. Mat. Vol. 28 No. 3 (1999), p.214.

DOI: https://doi.org/10.1007/s11664-999-0016-z

[8] Y. Tanaka, H. Tanoue, and K. Arai: Mat. Sci. Forum Vol. 433-436 (2003), p.605.

[9] D.C. Sheridan, G. Niu, and J.D. Cressler: Solid-State Electr. Vol. 45 (2001), p.1659.

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