Assessment of "Normally On" and "Quasi On" SiC VJFET's in Half-Bridge Circuits

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1153-1156

DOI:

10.4028/www.scientific.net/MSF.457-460.1153

Citation:

M. S. Mazzola et al., "Assessment of "Normally On" and "Quasi On" SiC VJFET's in Half-Bridge Circuits", Materials Science Forum, Vols. 457-460, pp. 1153-1156, 2004

Online since:

June 2004

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