Assessment of "Normally On" and "Quasi On" SiC VJFET's in Half-Bridge Circuits


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Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet




M. S. Mazzola et al., "Assessment of "Normally On" and "Quasi On" SiC VJFET's in Half-Bridge Circuits", Materials Science Forum, Vols. 457-460, pp. 1153-1156, 2004

Online since:

June 2004




[1] J. A. Cooper, Jr.: Mater. Sci. Forum Vols. 389-393 (2002), p.15.

[2] B. Allebrand and H-P Nee: Proc. 9th Euro. Conf. Power Electronics & Applications (2001).

[3] Y. Luo, L. Fursin, J.H. Zhao, P. Alexandrov, B. Wright, and M. Weiner: Mat. Sci. Forum, Vols. 389-393 (2002), p.1325.

[4] S. B. Bayne, C. W. Tipton, T. E. Griffin, C. J. Scozzie, and B. Geil: Proc. 25th Inter. Power Modulator Symp (IEEE, New York 2002) p.207.

[5] Peter Friedrichs, Heinz Mitlehner, Reinhold Schorner, Karl-Otto Dohnke, Rudolf Elpelt, and Dietrich Stephani: Mat. Sci. Forum Vols. 389-393 (2002), p.1185.

DOI: 10.4028/

[6] J. H. Zhao, X. Li, K. Tone, P. Alexandrov, M. Pan, and M. Weiner: Mat. Sci. Forum Vols. 389- 393 (2002), p.1223.

[7] R. Rupp and I. Zverev: Mat. Sci. Forum, Vols. 433-436 (2003), p.805.

[8] F. White, Heat Transfer (Addison, Reading, Massachusetts, 1984), p.172.

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