X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1601-1604

Citation:

B. Poust et al., "X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC", Materials Science Forum, Vols. 457-460, pp. 1601-1604, 2004

Online since:

June 2004

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