Radiotracer Spectroscopy on Group II Acceptors in GaN

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1609-1612

Citation:

F. Albrecht et al., "Radiotracer Spectroscopy on Group II Acceptors in GaN", Materials Science Forum, Vols. 457-460, pp. 1609-1612, 2004

Online since:

June 2004

Export:

Price:

$38.00

[1] W. Götz, R.S. Kern, C.H. Chen, H. Liu, D.A. Steigerwald, R.M. Fletcher, Mater. Sci. Eng. B 59, 211(1999).

[2] D.P. Bour, H.F. Chung, W. Götz, L. Romano, B.S. Krusor, D. Hofstetter, S. Rudaz, C.P. Kuo, F.A. Ponce, N.M. Johnson, M.G. Craford, R.D. Bringans in III-V-Nitrids, edited by F.A. Ponce, T.D. Moustakas, I. Akasaki, B. Monemar, Mater. Res. Soc. Symp. Proc. No. 449 (Materials Research Society, Pittsburgh, 1997), 509.

DOI: https://doi.org/10.1557/proc-449-509

[3] F. Bernardini, V. Fiorentini, A. Bosin, Appl. Phys. Lett. 70, 2990 (1997).

[4] F. Mireles, S.E. Ulloa, Phys. Rev. B 58, 3879 (1998).

[5] A. Salvador, W. Kim, Ö. Aktas, A. Botchkarev, Z. Fan, H. Morkoç, Appl. Phys. Lett. 69, 2692, (1996).

[6] D.J. Dewsnip, A.V. Adrianov, I. Harrison, J.W. Orton, D.E. Lacklinson, G.B. Ren, S.E. Hooper, T.S. Cheng, C.T. Foxon, Semicond. Sci. Technol. 13, 500 (1997).

[7] C. Ronning, E.P. Carlson, D.B. Thomson, R.F. Davis, Appl. Phys. Lett. 73, 1622 (1998).

[8] Y. Sun, L.S. Tan, S. Chua, S. Prakash, MRS INTERNET JNSR 5, W3. 82 (2000).

[9] Y. Nakano, T. Jimbo, Appl. Phys. Lett. 81, 3990 (2002).

[10] K.H. Ploog, O. Brandt, J. Vac. Sci. Technol. A 16, 1609 (1998).

[11] Y. Nakano, T. Kachi, T. Jimbo, Appl. Phys. Lett. 82, 2082 (2003).

[12] J. Neugebauer, C. Van de Walle, J. Appl. Phys. 85, 3003 (1998).

[13] C.G. Van de Walle, S. Limpijumnong, J. Neugebauer, Phys. Rev. B 63, 245205 (2001).

[14] N. Achtziger, W. Witthuhn, Phys. Rev. B 57, 12181 (1998).

[15] J.F. Ziegler, J.B. Biersack, U. Littmark, The Stopping and Range of Ions in Solids (Pergamon Press, New York, 1985).

[16] C. Ronning, K.J. Linthicum, E.P. Carlson, P.J. Hartlieb, D.B. Thomson, T. Gehrke, R.F. Davis, MRS INTERNET JNSR 4, G3. 17 (1999).

[17] J.L. Pautrat, B. Katircioglu, N. Magnea, D. Bensahel, J.C. Pfister, L. Revou, Solid State Electronics 23, 1159 (1980).

DOI: https://doi.org/10.1016/0038-1101(80)90028-3

[18] P. Blood, J.W. Orton: The electrical Charaterization of Semiconductors: Majority Carriers and Electron States (Academic Press, London, 1992) p.407.

[19] C.C. Yu, C.F. Chu, J.Y. Tsai, C.F. Lin, S.C. Wang, J. Appl. Phys. 92, 1881 (2002) *Electronic mail: albrecht@pinet. uni-jena. de *current adress: Fysisk institutt, Postboks 1048 - Blindern, 0316 Oslo, Norway.

Fetching data from Crossref.
This may take some time to load.