Thermal Characterisation of AlGaN/GaN HEMTs using Micro-Raman Scattering Spectroscopy and Pulsed I-V Measurements

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1625-1628

DOI:

10.4028/www.scientific.net/MSF.457-460.1625

Citation:

R. Aubry et al., "Thermal Characterisation of AlGaN/GaN HEMTs using Micro-Raman Scattering Spectroscopy and Pulsed I-V Measurements", Materials Science Forum, Vols. 457-460, pp. 1625-1628, 2004

Online since:

June 2004

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