TEM of Dislocations in Forward-Biased 4H-SiC PiN Diodes


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Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet




M. Zhang et al., "TEM of Dislocations in Forward-Biased 4H-SiC PiN Diodes", Materials Science Forum, Vols. 457-460, pp. 359-362, 2004

Online since:

June 2004




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