Annealing Study on Radiation-Induced Defects in 6H-SiC

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

517-520

Citation:

M.V.B. Pinheiro et al., "Annealing Study on Radiation-Induced Defects in 6H-SiC", Materials Science Forum, Vols. 457-460, pp. 517-520, 2004

Online since:

June 2004

Export:

Price:

$38.00

[1] N.M. Pavlov, M.I. Iglitsyn, M.G. Kosaganova and V.N. Solomatin: Sov. Phys. Semicond. Vol. 9 (1976), p.845.

[2] V.S. Vainer and V.A. II'in: Sov. Phys. Semicond. Vol. 23 (1981), p.2126.

[3] J. Schneider and K. Maier: Physica B Vol. 185 (1993), p.199.

[4] H. Itoh, M. Yoshikawa, I. Nashiyama, S. Misawara, H. Okumura and S. Yoshida: IEEE Trans. Nucl. Sci. Vol. 37 (1990), p.1732.

[5] E. Sörman, N.T. Son, W.M. Chen, O. Kordina, C. Hallin and E. Janzén: Phys. Rev. B Vol. 61 (2000), p.2613.

[6] M. Wagner, B. Magnusson, W.M. Chen, E. Janzén, E. Sörman, C. Hallin and J.L. Lindström: Phys. Rev. B Vol. 62 (2000), p.16555.

DOI: https://doi.org/10.1103/physrevb.62.16555

[7] T. Wimbauer, B.K. Meyer, A. Hofstaetter, A. Scharmann and H. Overhof: Phys. Rev. B. Vol. 56 (1997), p.7384.

[8] Th. Lingner, S. Greulich-Weber, J. -M. Spaeth, U. Gerstmann, E. Rauls, Z. Hajnal, Th. Frauenheim and H. Overhof: Phys. Rev. B Vol. 64 (2001), p.245212.

DOI: https://doi.org/10.1103/physrevb.64.245212

[9] N.T. Son, P.N. Hai, M. Wagner, W.M. Chen, A. Ellison, C. Hallin, B. Monemar and E. Janzén: Semicond. Sci. and Technol. Vol. 14 (1999), p.1141.

[10] N.T. Son, E. Sörman, W.M. Chen, C. Hallin, O. Kordina, B. Monemar and E. Janzén: Phys. Rev. B Vol. 55 (1997), p.2863.

[11] J. -M. Spaeth, H. Overhof: Microscopic and Electronic Structure of Point Defects in Semiconductors and Insulators. Determination and Interpretation of Paramagnetic Hyperfine Interactions. Springer Series in Materials Science Vol. 51, Springer-Verlag, Berlin (2003).

DOI: https://doi.org/10.1007/978-3-642-55615-9_2

Fetching data from Crossref.
This may take some time to load.