Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers


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Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet




R. S. Okojie et al., "Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers ", Materials Science Forum, Vols. 457-460, pp. 529-532, 2004

Online since:

June 2004




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