Optical Investigation of the Built-In Strain in 3C-SiC Epilayers


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Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet




A. Galeckas et al., "Optical Investigation of the Built-In Strain in 3C-SiC Epilayers", Materials Science Forum, Vols. 457-460, pp. 657-660, 2004

Online since:

June 2004




[1] T. Chassagne, G. Ferro, C. Gourbeyre, M. Le Berre, D. Barbier and Y. Monteil: Mater. Sci. Forum Vols. 353-356 (2001), p.155.

DOI: 10.4028/www.scientific.net/msf.353-356.155

[2] A. Matsuura, Y. Masuda, Y. Chen and S. Nishino: Mater. Sci. Forum Vols. 353-356 (2001), p.495.

[3] H.W. Shim, K.C. Kim, Y.H. Seo, K.S. Nahm, E.K. Suh, H.J. Lee, and Y.G. Hwang: Appl. Phys. Lett. Vol. 70 (1997), p.1757.

[4] T. Matsumoto, J. Takahashi, T. Tamaki, T. Futagi, H. Himura, and Y. Kanemitsu: Appl. Phys. Lett. Vol. 64 (1994), p.226.

[5] L. S. Liao, X. M. Bao, Z. F. Yang, and N. B. Min: Appl. Phys. Lett. Vol. 66 (1995), p.2382.

[6] A. O. Konstantinov, A. Henry, C.I. Harris, and E. Janzen: Appl. Phys. Lett. Vol. 66 (1995), p.2250.

[7] H. Tamura, M. Rueckschloss, T. Wirschem, and S. Veprek: Appl. Phys. Lett. Vol. 65 (1994), p.1537.

[8] H. Munekata, S. Murasato, and H. Kukimoto: Appl. Phys. Lett. Vol. 37 (1980), p.536.

[9] D. L. Staebler and C. R. Wronsky: Appl. Phys. Lett. Vol. 31 (1977), p.292.

[10] M. Stutzmann, W. B. Jackson, and C. C. Tsai: Phys. Rev. B Vol. 32 (1985), p.23.

[11] W. J. Choyke, Z. C. Feng, and J. A. Powell: J. Appl. Phys. Vol. 64 (1988), p.3163.

[12] H. Itoh, M. Yoshikawa, I. Nashiyama, H. Okumura, S. Misawa, and S. Yoshida: J. Appl. Phys. Vol. 77 (1995), p.837.

[13] P. Liaw and R. F. Davis: J. Electrochem. Soc. Vol. 131(1988), p.3014.

[14] C. H. Park, B. H. Cheong, K. H. Lee, and K. J. Chang: Phys. Rev. B Vol. 49 (1994), p.4485.

[15] W. J. Choyke: NATO ASI Series E, Applied Sciences, Vol. 185 (1990), p.563.

[16] P. Lautenschlager, P. B. Allen, and M. Cordona: Phys. Rev. B Vol. 31 (1985).

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