Position Resolved In-Situ X-Ray Observation of Recrystallization and Its Description by Self-Organized Criticality


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A novel X-ray diffraction method, allowing the position resolved imaging of a polycrystalline specimen using the diffracted radiation, was applied for in situ investigation of recrystallization of cold-rolled copper. A large area of the specimen could be observed simultaneously, yielding information about nucleation and growth of many individual crystallites. The recrystallization process showed a stochastic behavior which can be described by the model of self-organized criticality.



Materials Science Forum (Volumes 467-470)

Edited by:

B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot




T. Wroblewski "Position Resolved In-Situ X-Ray Observation of Recrystallization and Its Description by Self-Organized Criticality ", Materials Science Forum, Vols. 467-470, pp. 689-696, 2004

Online since:

October 2004




[1] Juul Jensen, D., Poulsen, H.F., Recrystallization in 3d, in: N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, J.A. Wert, Proc. 21st Riso Int. Symp. Mat. Sci, Risø National Laboratory, Roskilde pp.103-124, (2000).

[2] Wroblewski, T., Geier, S., Hessmer, R., Schreck, M., Rauschenbach, B., X-ray imaging of polycrystalline materials, Rev. Sci. Instrum. Vol. 66, pp.3560-3562 , (1995).

DOI: https://doi.org/10.1063/1.1145469

[3] Wroblewski, T., Clauß, O., Crostack, H. -A., Ertel, A., Fandrich, F., Genzel, Ch., Hradil, K., Ternes, W., Woldt, E., A new diffractometer for materials science and imaging at HASYLAB beamline G3, Nucl. Instrum. Meth. A Vol. 428, pp.570-582, (1999).

DOI: https://doi.org/10.1016/s0168-9002(99)00144-8

[4] Wroblewski, T., and Woldt, E., Non-ambient micro diffraction, Adv. X-ray Anal. Vol. 42-30 CDROM.

[5] Humphreys, F.J., Hatherly, M., Recrystallization and Related Annealing Phenomena, Pergamon, Oxford, (1996).

[6] Wroblewski, T., Self-organized criticality - a model for recrystallization ?, Z. Metallkd., Vol. 93, pp.1228-1232, (2002).

[7] Juul Jensen, D., Lauridsen, E.M., Vandermeer, R.A., In-situ determination of grain boundary migration during recrystallization", in: Ankem, S., Pande, C.S., Ovid, ko, I., Ranganathan, S., Science & Technology of Interfaces, TMS, pp.361-374, (2002).

DOI: https://doi.org/10.1002/9781118788103.ch31

[8] Lauridsen, E.M., The 3d X-ray diffraction microscope and its application to the study of recrystallization kinetics, Risø-Report-1266(EN), (2001).

[9] Duggan, B.J., L¨ucke, K., K¨ohlhoff, G., Lee, C.S., On the origin of cube texture in copper, Acta metall. mater. Vol. 41, pp.1921-1927, (1993).

[10] Samajdar, I., Doherty, R.D., Role of S[{123}< 634 >] orientations in the preferred nucleation of cube grains in recrystallization of fcc metals, Scripta metall. mater. Vol. 32, pp.845-850, (1995).

DOI: https://doi.org/10.1016/0956-716x(95)93212-m

[11] Bak, P., Tang, C., Wiesenfeld, K., Self-organized criticality: An explanation for 1/f noise, Phys. Rev. Lett. Vol. 59, pp.381-384, 1987. This article was processed using the LATEX macro package with TTP style.

DOI: https://doi.org/10.1103/physrevlett.59.381

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