Position Resolved In-Situ X-Ray Observation of Recrystallization and Its Description by Self-Organized Criticality

Abstract:

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A novel X-ray diffraction method, allowing the position resolved imaging of a polycrystalline specimen using the diffracted radiation, was applied for in situ investigation of recrystallization of cold-rolled copper. A large area of the specimen could be observed simultaneously, yielding information about nucleation and growth of many individual crystallites. The recrystallization process showed a stochastic behavior which can be described by the model of self-organized criticality.

Info:

Periodical:

Materials Science Forum (Volumes 467-470)

Edited by:

B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot

Pages:

689-696

DOI:

10.4028/www.scientific.net/MSF.467-470.689

Citation:

T. Wroblewski "Position Resolved In-Situ X-Ray Observation of Recrystallization and Its Description by Self-Organized Criticality ", Materials Science Forum, Vols. 467-470, pp. 689-696, 2004

Online since:

October 2004

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Price:

$35.00

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