In Situ Investigation of Bulk Nucleation by X-Ray Diffraction


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A new method for in-situ studies of nucleation in bulk metals based on high energy synchrotron radiation is presented. Copper samples cold rolled 20% are investigated. The crystallographic orientations near triple junctions are characterized using non-destructive 3DXRD microscopy before, during, and after annealing for 1 hour at 290°C. This method allows in-situ identification of new nuclei and the deformed material, which spawns the nuclei. Also, since data is acquired during annealing nucleation kinetics can be studied.



Materials Science Forum (Volumes 467-470)

Edited by:

B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot




A.W. Larsen et al., "In Situ Investigation of Bulk Nucleation by X-Ray Diffraction", Materials Science Forum, Vols. 467-470, pp. 81-86, 2004

Online since:

October 2004




[1] T.J. Sabin, G. Winther and D. Juul Jensen: Orientation relationships between recrystallization nuclei at triple junctions and deformed structures (Acta Mat. Vol. 51 (2003), pp.3999-4011).


[2] H. Hu: Recovery and recrystallization in Metals (Interscience, New York (1963), p.311).

[3] H.F. Poulsen, E.M. Lauridsen, S. Schmidt, L. Margulies and J.H. Driver: 3D-characterisation of microstructure evolution during annealing of a aluminum single crystal of the S-orientation (Acta Mat. Vol. 51 (2003), pp.2517-2529).


[4] R.A. Vandermeer and P. Gordon: Edge-nucleated, growth controlled recrystallization in aluminum (Met. Trans. Vol. 215 (1957), pp.577-588).

[5] H.F. Poulsen and D. Juul Jensen: From 2D to 3D microtexture investigations, 13. International conference on textures of materials (ICOTOM 13), Seoul (KR), 26-30 August 2002. (Mat. Sci. Forum 408-412 (2002), pp.49-66).


[6] M. Holscher, D. Raabe and K. Lucke: Relation between rolling textures and shear textures in fcc and bcc metals (Acta Metall. Mater. Vol. 42: 3 (1994), pp.879-886).


[7] A.W. Larsen: Logitech PM5D Precision Polishing and Lapping System, user manual (Risø-I2051(EN), Risoe National Laboratory, Roskilde, Denmark (2003).

[8] N.C.K. Lassen, D. Juul Jensen and K. Conradsen: Image-processing procedures for analysis of electron back scattering patterns (Scanning Microscopy Vol. 6: 1 (1992), pp.115-121).

[9] B.L. Adams: Orientation Imaging Microscopy: Application to measurement of grain boundary structure (Mat. Sci. Eng. Vol. 166(A): 59 (1993).