Growth and Properties of Half-Metallic Double Perovskite Thin Films

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Ferromagnetic oxides with ordered double-perovskites Sr2FeMoO6 and Sr2CrReO6 are known to be in a half-metallic ground state with high Curie temperatures Tc, and hence one of the promising materials for spin electronics. This paper reports epitaxial growth and micro-structural, magnetic, and electrical characterization of thin films of these oxides. It is shown that a coherent growth without strain relaxation, which is accomplished by the use of substrate or buffer layers with a small (0.1%) lattice match, is essential to obtain high quality films with both atomically flat surface and high magnetization values expected for their half-metallicity

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Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

2197-2202

DOI:

10.4028/www.scientific.net/MSF.475-479.2197

Citation:

H. Asano et al., "Growth and Properties of Half-Metallic Double Perovskite Thin Films", Materials Science Forum, Vols. 475-479, pp. 2197-2202, 2005

Online since:

January 2005

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$35.00

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