Atomic and Electronic Structures of Cu/Sapphire Interfaces by HRTEM and EELS Analyses
Interfacial atomic and electronic structures of Cu/Al2O3(0001) and Cu/Al2O3(11 ＿ ,20) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al2O3 systems.
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie
T. Sasaki et al., "Atomic and Electronic Structures of Cu/Sapphire Interfaces by HRTEM and EELS Analyses", Materials Science Forum, Vols. 475-479, pp. 3859-3862, 2005