Atomic and Electronic Structures of Cu/Sapphire Interfaces by HRTEM and EELS Analyses

Abstract:

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Interfacial atomic and electronic structures of Cu/Al2O3(0001) and Cu/Al2O3(11 _ ,20) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al2O3 systems.

Info:

Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

3859-3862

DOI:

10.4028/www.scientific.net/MSF.475-479.3859

Citation:

T. Sasaki et al., "Atomic and Electronic Structures of Cu/Sapphire Interfaces by HRTEM and EELS Analyses", Materials Science Forum, Vols. 475-479, pp. 3859-3862, 2005

Online since:

January 2005

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$35.00

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