A New Scheme for the Exit-Wave Reconstruction from a Small Set of Focus Series of HREM Images

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A new procedure is proposed for the exit electron wave reconstruction using a small set of high-resolution electron microscopy (HREM) images. This procedure is similar to that proposed by van Dyck and coworkers, but the relative shifts between different HREM images are obtained via the genetic algorithm instead of the more widely used cross-correlation function (XCF) method. The new procedure is demonstrated using simulated HREM images with added noise, and shown to be able to deal with situation where the scheme based on the method of XCF is not applicable.

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Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

4059-4062

DOI:

10.4028/www.scientific.net/MSF.475-479.4059

Citation:

F. Lin et al., "A New Scheme for the Exit-Wave Reconstruction from a Small Set of Focus Series of HREM Images", Materials Science Forum, Vols. 475-479, pp. 4059-4062, 2005

Online since:

January 2005

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$35.00

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