Negative Capacitance Phenomena in CZT Room Temperature Radiation Detectors

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CdZnTe , Cadmium zinc telluride (CZT) is an interesting room temperature radiation detector. This research paper is reporting a negative capacitance behavior of CZT detectors at bias voltages around 60V. Initially at 0V, the CZT capacitance is positive and decreases with bias voltage increase. At around 60V, the measured capacitance approaches zero, then with small voltage increase , capacitance value reverses sign and starts to increase in the negative direction with increasing bias voltage . This effect is stable at 100 kHz. The behavior of low and other quality detectors can differ, low quality detectors can show negative capacitance at low bias voltages and low frequencies. The initial explanation of this phenomena is due to non-uniform distribution of impurities inside the bulk material.

Info:

Periodical:

Materials Science Forum (Volumes 480-481)

Edited by:

A. Méndez-Vilas

Pages:

399-404

Citation:

M. A. Hassan "Negative Capacitance Phenomena in CZT Room Temperature Radiation Detectors", Materials Science Forum, Vols. 480-481, pp. 399-404, 2005

Online since:

March 2005

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Price:

$38.00

[1] M. Ershov, H.C. Liu, L. Li, M. Buchanan, Z.R. Wasilewski, A.K. Jonscher, Negative capacitance effect in semiconductor devices, IEEE Trans. Electron Devices 45(10)(1998)2196-2206.

DOI: https://doi.org/10.1109/16.725254

[2] J. Kemmer, D. Hauff, N. Krause, Ch. Krieglmeyer, Yang Yinxiang, Current and capacitance measurements as a fast diagnostic tool for evaluation of semiconductor parameters, Nucl. Inst. Methods A 439(2000)199-207.

DOI: https://doi.org/10.1016/s0168-9002(99)00929-8

[3] T.E. Sclesinger, R.B. James, Semiconductors for Room Temperature Nuclear Detectors, Academic Press, London, (1995).

[4] Uni Lachish, CdTe and CdZnTe Crystal Growth and Products of Gamma Radiation Detectors, urila@internet-zahav. net, (2000).

[5] F.P. Doty, J.F. Butler, J. F Schetzina, K.A. Bowers, Properties of CdZnTe crystals grown by a high pressure Bridgman method, J. Vac. Sc. Technol, B10(1992)1418.

DOI: https://doi.org/10.1116/1.586264

[6] Yinnel Tech Inc. , 3702 West Sample Street , South Band , Indiana 46619 , USA.

[7] B. Redus, Amptec Applicatio Note ANCZT-2 Rerv. 1, (2000).

[8] R. Arlt, V. Ivanov, K. Parnham, Advantages and Use of CdZnTe Detectors in Saeguards, MPC&A Conference, Obninsk, Russia, (2000).

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