Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors

Abstract:

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High performance SiC detectors for ionising radiation have been designed, manufactured and tested. Schottky junctions on low-doped epitaxial 4H-SiC with leakage current densities of few pA/cm2 at room temperature has been realised at this purpose. The epitaxial layer has been characterised at different dose of radiations in order to investigate the SiC radiation hardness. The response of the detectors to alpha and beta particle and to soft X-ray have been measured. High energy resolution and full charge collection efficiency have been successfully demonstrated.

Info:

Periodical:

Materials Science Forum (Volumes 483-485)

Edited by:

Roberta Nipoti, Antonella Poggi and Andrea Scorzoni

Pages:

1015-1020

DOI:

10.4028/www.scientific.net/MSF.483-485.1015

Citation:

G. Bertuccio et al., "Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors", Materials Science Forum, Vols. 483-485, pp. 1015-1020, 2005

Online since:

May 2005

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Price:

$35.00

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