Electronic Levels Induced by Irradiation in 4H-Silicon Carbide

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The effects of irradiation with protons and electrons on 4H-silicon carbide epilayers were investigated. The particle energy was 6.5 and 8.2 MeV. The electronic levels associated with the irradiation-induced defects were analyzed by current-voltage characteristics and deep level transient spectroscopy measurements up to 700 K. In the same temperature range the apparent free carrier concentration was measured by capacitance-voltage characteristics to monitor possible compensation effects due to the deep level associated to the induced defects. Introduction rate, enthalpy and capture cross-section of such deep levels were compared and some conclusions about the nature of the defects were drawn.

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Periodical:

Materials Science Forum (Volumes 483-485)

Edited by:

Dr. Roberta Nipoti, Antonella Poggi and Andrea Scorzoni

Pages:

359-364

Citation:

A. Castaldini et al., "Electronic Levels Induced by Irradiation in 4H-Silicon Carbide", Materials Science Forum, Vols. 483-485, pp. 359-364, 2005

Online since:

May 2005

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$38.00

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