Approximate Analytical Formulae to Evaluate the Uncertainty in X-Ray Stress Analysis

Abstract:

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The global uncertainty, in X-ray stress analysis, is due to many factors but one of the most important is the uncertainty on peak positions due to counting statistics and other random errors on peak positions. Although a lot of work has been done to estimate the latter, very little work has been devoted to its propagation through the least square regression. This work presents some analytical results in the general case of triaxial stress state (elliptic curve fit) and proposes approximate formulae to easily compute the uncertainty on normal and shear stress components from acquisition parameters such as the number N of y tilts and the maximum y value. It was found that the latter only influences significantly the uncertainty on the normal stress component and that the dependency of the uncertainty on N does not necessarily follow a 1/ N relation.

Info:

Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

124-124

DOI:

10.4028/www.scientific.net/MSF.490-491.124

Citation:

M. François et al., "Approximate Analytical Formulae to Evaluate the Uncertainty in X-Ray Stress Analysis", Materials Science Forum, Vols. 490-491, pp. 124-124, 2005

Online since:

July 2005

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Price:

$35.00

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