In Situ Synchrotron Measurements of Oxide Growth Strains


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Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal A1 FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (~80keV) x-rays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of -3.7 GPa.



Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu




J. Almer et al., "In Situ Synchrotron Measurements of Oxide Growth Strains", Materials Science Forum, Vols. 490-491, pp. 287-293, 2005

Online since:

July 2005




[1] Throughout the heating and cooling cycles, diffraction data were 3 recorded from both the sample and reference tab, with typical exposure times of 30 sec and collection intervals of 2-5 min.