Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera
p.197
p.197
The Effect of Grain Orientation on Micro Frictional of Medium Carbon Steel
p.203
p.203
Scalar Measures of Texture Heterogeneity
p.207
p.207
Optical Grain Size Measurements: What is Being Measured? Comparative Study of Optical and EBSD Grain Sizes Determination in 2D Al Foil
p.213
p.213
Unbiased Evaluation of Chord Length Distributions from Orientation Maps
p.219
p.219
Extension of Orientation Mapping to the Transmission Electron Microscope
p.225
p.225
Effect of Orientation Noise on the Determination of Percolation Thresholds from Electron Back-Scatter Pattern Data
p.231
p.231
Three-Dimensional Texture Analysis
p.237
p.237
High Resolution Texture Analysis with Spherical Wavelets
p.245
p.245
Unbiased Evaluation of Chord Length Distributions from Orientation Maps
Abstract:
Grain structures in crystalline material are commonly identied by orientation inhomogeneities in orientation maps. A statistical approach is introduced to extract quantitative information on the chord length distribution of grains from orientation data gathered by electron back-scattering diffraction.
Info:
Periodical:
Materials Science Forum (Volumes 495-497)
Main Theme:
Edited by:
Paul Van Houtte and Leo Kestens
Pages:
219-224
DOI:
10.4028/www.scientific.net/MSF.495-497.219
Citation:
W. Pantleon, "Unbiased Evaluation of Chord Length Distributions from Orientation Maps ", Materials Science Forum, Vols. 495-497, pp. 219-224, 2005
Online since:
September 2005
Authors:
Price:
$35.00
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