Ion Beam Analysis of Ge/Si Dots Grown on Ultrathin SiO2 Interlayers

Abstract:

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Monolayer (ML) thick Ge deposition on (100) Si substrates by molecular beam epitaxy (MBE) technique using an ultrathin SiO2 interlayer has been studied by ion beam analysis and photoluminescence (PL). The dependence of the Ge layer growth mode on the amount of the deposited Ge and the SiO2 thickness has been investigated. Atomic hydrogen treatment has been performed in order to passivate non-radiative recombination channels and to enhance the PL intensity. We conclude the formation of Ge quantum dots for the sample with the thickest Ge and SiO2 layers (9 Å and 1 ML, respectively).

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

1121-1124

DOI:

10.4028/www.scientific.net/MSF.514-516.1121

Citation:

A. Fonseca, E. Alves, J. P. Leitão, N. A. Sobolev, M. C. Carmo, A. I. Nikiforov, "Ion Beam Analysis of Ge/Si Dots Grown on Ultrathin SiO2 Interlayers", Materials Science Forum, Vols. 514-516, pp. 1121-1124, 2006

Online since:

May 2006

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$35.00

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