Growth, Crystal Structure and Stability of Ag-Ni/Cu Films

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AgxNi1-x (x=0.0-1.0) films were grown on Cu substrates by electrodeposition method. The films were found to be a nanocrystalline mixture of pure silver and nickel. The grain sizes were determined by X-ray diffraction and electron microscopy techniques. The minimal value was 3.3 m for the alloy with 70 wt% concentration of Ni. The stability of the grown films upon heating in ir and in vacuum was examined. An increase in the grain size was found to begin at 150°C.

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

1166-1170

DOI:

10.4028/www.scientific.net/MSF.514-516.1166

Citation:

I. K. Bdikin et al., "Growth, Crystal Structure and Stability of Ag-Ni/Cu Films", Materials Science Forum, Vols. 514-516, pp. 1166-1170, 2006

Online since:

May 2006

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$35.00

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