Characterization of Porous Nanostructures

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Fractal and aggregate structures of porous materials were studied by a variety of the structure characterization techniques (TEM, small angle X-ray scattering, nitrogen sorption). Scattering data (SAXS, USAXS) for porous materials measured with laboratory equipment and synchrotron technique were interpreted in terms of Guinier, Emmerling, Freltoft, modified Freltoft theories, and simple power law expressions. The evaluation of scattering measurements resulted in fractal dimensions, sizes of the elementary units, the fractal domains or the aggregates. TEM images confirmed the sizes of the elementary building units, while the pore size distributions could be obtained by nitrogen adsorption. The specific surface area was calculated with respect to the possibility of multilayer formation during nitrogen absorption.

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

1191-1195

DOI:

10.4028/www.scientific.net/MSF.514-516.1191

Citation:

K. Sinko et al., "Characterization of Porous Nanostructures", Materials Science Forum, Vols. 514-516, pp. 1191-1195, 2006

Online since:

May 2006

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Price:

$38.00

[1] A. Guinier and G. Fournet: Small-Angle Scattering of X-ray, (John Wiley, New York 1955).

[2] T. Freltoft, J.K. Kjems, and S.K. Sinha: Phys. Rew. B. Vol. 33 (1986), p.269.

[3] A. Emmerling, R. Petricevic, A. Beck, P. Wang, H. Scheller, and J. Fricke: J. Non-Cryst. Solids Vol. 228 (1995), p.240.

[4] K. Sinkó and R. Mezei: J. Non-Cryst. Solids Vol. 231/1-2 (1998), p.1.

[5] K. Sinkó and V. Torma: SAXS investigation of Porous Nanostructures, submitted to Langmuir.

[6] Pászli, I. Exact method for the determination of the specific surface area, 9 th Int. Symp. Particle Size Analysis, Hungary, (2004).

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