Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors

Abstract:

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This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 m with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz).

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

13-17

DOI:

10.4028/www.scientific.net/MSF.514-516.13

Citation:

R. Martins et al., "Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors", Materials Science Forum, Vols. 514-516, pp. 13-17, 2006

Online since:

May 2006

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Price:

$35.00

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