Sub-Surface Defects Induced by Low Energy Ar+ Sputtering of Silver

Abstract:

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Induced defects in silver polycrystalline samples irradiated with 4 keV Ar+ were characterised with slow positron implantation spectroscopy. The implanted gas was found to interact with ion irradiation defects. The evolution of the defects and gas-defect interactions were followed through a multi-step isochronal annealing treatment. Two different defected regions were detected. A region near to the surface, due to a distribution of vacancy-like defects produced by irradiation, and a deeper one due to coalescence of Ar. The deeper defects evolve with thermal treatments and probably produce cavities which are not easily recovered.

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

1608-1612

DOI:

10.4028/www.scientific.net/MSF.514-516.1608

Citation:

M. Duarte Naia et al., "Sub-Surface Defects Induced by Low Energy Ar+ Sputtering of Silver", Materials Science Forum, Vols. 514-516, pp. 1608-1612, 2006

Online since:

May 2006

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$35.00

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