Sub-Surface Defects Induced by Low Energy Ar+ Sputtering of Silver


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Induced defects in silver polycrystalline samples irradiated with 4 keV Ar+ were characterised with slow positron implantation spectroscopy. The implanted gas was found to interact with ion irradiation defects. The evolution of the defects and gas-defect interactions were followed through a multi-step isochronal annealing treatment. Two different defected regions were detected. A region near to the surface, due to a distribution of vacancy-like defects produced by irradiation, and a deeper one due to coalescence of Ar. The deeper defects evolve with thermal treatments and probably produce cavities which are not easily recovered.



Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho




M. Duarte Naia et al., "Sub-Surface Defects Induced by Low Energy Ar+ Sputtering of Silver", Materials Science Forum, Vols. 514-516, pp. 1608-1612, 2006

Online since:

May 2006




[1] H. Gnaser: Low-energy ion irradiation of solid surfaces (Springer-Verlag, Berlin 1999).

[2] P.G. Coleman: Positron beams and their applications (World Scientific, Singapore, 2000).

[3] J.F. Ziegler: SRIM-2003 - The Stopping and range of ions in matter (USNA, Annaplois 2003); J.F. Ziegler: Nucl. Instr. and Meth. B 219-220 (2004) p.1027.

[4] R.P. Webb: Suspre - Surrey university sputter profile resolution from energy deposition (Surrey University, Surrey 2001).

[5] P.G. Coleman, F. Malik and A.P. Knights: J. Phys.: Condens. Matter Vol. 14 (2002), p.681.

[6] A. van Veen, J. de Vries, R. Hakvoort and M.R. IJpma: In Positron beams for solids and surfaces SLOPOS - 4 (AIP, Ontario 1990), p.171.

[7] O.M.N. D. Teodoro, J.A.M.C. Silva and A.M.C. Moutinho: Vacuum Vol. 46 (1995), p.1205.

[8] A. Zecca, M. Bettonte, J. Paridaens, G.P. Karwasz and R.S. Brusa: Meas. Sci. Technol. Vol. 9 (1998), p.409.

[9] M. Duarte Naia, P.M. Gordo, A.P. de Lima, O.M.N.D. Teodoro and A.M.C. Moutinho: In Resumos da 12ª Conferência Nacional de Fisica (SPF, Évora 2000), p.408.

[10] R.S. Brusa, G.P. Karwasz, N. Tiengo, A. Zecca, et al.: Phys. Rev. B Vol. 61 (2000), p.10154.

[11] M. Duarte Naia, P.M. Gordo, A.P. de Lima, A.M.C. and R.S. Brusa: Mat. Sci. Forum Vol. 455-446 (2004), p.623.

[12] A. van Veen: Mat. Sci. Forum 15-18 (1987), p.3.