On a New Method Based on X-Ray Diffraction to Identify Stress-Strain Laws on Surface-Treated Materials

Abstract:

Article Preview

A characterisation technique based on the stress determination by X-ray diffraction has been developed. It enables the identification of elastoplastic stress-strain laws on materials presenting an in-depth gradient of mechanical properties on its cross section. This technique is especially suitable to the characterisation of surfaces due to the small X-rays penetration depth. The method was applied in the characterisation of a carbonitrided and shot-peened steel, allowing to evaluate the stress-strain laws of the material at the surface, the intermediate layers and the bulk material. In addition, the in-depth evolution of microhardness, residual stresses, diffraction peak broadening and retained austenite contents were analysed. This allowed to understand the results of the proposed technique.

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

1623-1627

DOI:

10.4028/www.scientific.net/MSF.514-516.1623

Citation:

A. C. Batista et al., "On a New Method Based on X-Ray Diffraction to Identify Stress-Strain Laws on Surface-Treated Materials", Materials Science Forum, Vols. 514-516, pp. 1623-1627, 2006

Online since:

May 2006

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.