Relaxor-Like Behavior of Self-Polarized Pb(Zr,Ti)O3 Thin Films


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Self-polarized Pb(Ti,Zr)O3 thin films deposited under lead enriched conditions by multitarget reactive sputtering at low substrate temperatures are characterized by tetravalent B-site occupation of excess lead. The imaginary part of the dielectric constant of such films shows a relaxor-like behavior. Evidence of a Pb2+/Pb4+ mixed valence is given by the temperature and frequency dependence of the ac conductivity. PbO volatility starts to deplete the growing film at a critical temperature of 500°C and Pb4+ formation disappears.



Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho




G. Suchaneck et al., "Relaxor-Like Behavior of Self-Polarized Pb(Zr,Ti)O3 Thin Films", Materials Science Forum, Vols. 514-516, pp. 175-178, 2006

Online since:

May 2006




[1] A. Deineka, L. Jastrabik, G. Suchaneck, and G. Gerlach: Phys. Stat. Sol. (a) Vol. 188 (2001), p.1549.

[2] G. Suchaneck, T. Sandner, A. Deyneka, G. Gerlach, and L. Jastrabik: Ferroelectrics Vol. 298 (2004), p.309.

DOI: 10.1080/00150190490423787

[3] X. Lu, F. Schlaphof, S. Grafström, Ch. Loppacher, L.M. Eng, G. Suchaneck, and G. Gerlach: Appl. Phys. Lett. Vol. 81 (2002), p.3215.

[4] R. Bruchhaus, D. Pitzer, R. Primig, W. Wersing, and Y. Xu: Integrated Ferroelectrics Vol. 14 (1997), p.141.

DOI: 10.1080/10584589708019986

[5] R.W. Whatmore, Z. Huang, and M. Todd: J. Appl. Phys. Lett. Vol. 82 (1997), p.5686.

[6] P. Muralt, S. Hiboux, C. Mueller, T. Maeder, L. Sagalowicz, T. Egami, and N. Setter: Integrated Ferroelectrics Vol. 36 (2001), p.53.

DOI: 10.1080/10584580108015527

[7] G. Suchaneck, A. Deyneka, L. Jastrabik, M. Savinov, and G. Gerlach: Ferroelectrics Vol. 318 (2005), (in print).

[9] M. Mandeljc, B. Maltic, and M. Kosec: Processing of Electroceramics Symposium 2003 (Jozef Stefan Institute, Bled, 2003) [www. polecer. rwth-aachen. de/Bled. Poster. Mandeljc. jpg].

[10] D.A. Hall, and P.J. Stevenson: Ferroelectrics Vol. 228 (1999), p.139.

[11] G. Suchaneck, A. Deyneka, L. Jastrabik, and G. Gerlach: Integrated Ferroelectrics Vol. 62 (2004), p.55.

[12] D. Viehland, S.J. Jang, and L.E. Cross: J. Appl. Phys. Vol. 68 (1990), p.2916.

[13] R. Stumpfe, D. Wagner, and D. Bäuerle: Phys. Stat. Sol. Vol. (a) 75 (1983), p.143.

[14] R.E. Cohen: Nature Vol. 258 (1992), p.136.

[15] Tae-Yong Kim, and Hyun M. Jang: Appl. Phys. Lett. Vol. 77 (2000), p.3824.

[16] P. Ganguly and M.S. Hegde: Phys. Rev. Vol. 37 (1988) p.5107.

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