Structural Characterization of Lead Metaniobate Thin Films Deposited by Pulsed Laser Ablation

Abstract:

Article Preview

The ferroelectric polymorph of lead metaniobate (PbNb2O6) presents an orthorhombic structure that is metastable at room temperature. This phase is obtained by quenching from high temperature. The fabrication of lead niobate thin films with this orthorhombic form has been reported to be difficult due to the presence of phases with the rhombohedric form or other nonstoichiometric phases. In this work, lead niobate thin films have been prepared by laser ablation, at different oxygen pressures and with different substrate temperatures. Their structure was studied by X-ray diffraction and their surface was examined by scanning electron microscopy (SEM). The results show that for low deposition temperatures the films presented a rhombohedric-PbNb2O6 structural phase. As Tdep increases the films started to develop an orthorhombic- PbNb2O6 structure that appeared at 400°C and remains up to 600°C. For lower oxygen pressure during deposition, a mixture of this phase and other orthorhombic lead deficient phases are present in the films. On the other hand, by increasing the oxygen pressure the lead deficient phases are strongly reduced and the films present only the orthorhombic- PbNb2O6 structure.

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Edited by:

Paula Maria Vilarinho

Pages:

207-211

DOI:

10.4028/www.scientific.net/MSF.514-516.207

Citation:

F. Cardoso et al., "Structural Characterization of Lead Metaniobate Thin Films Deposited by Pulsed Laser Ablation", Materials Science Forum, Vols. 514-516, pp. 207-211, 2006

Online since:

May 2006

Export:

Price:

$35.00

[1] - S. Ray, E. Gunther, and H.J. Ritzhaupt-Kleissl: J. Mater. Sci. Vol. 35 (2000), p.6221.

[2] - P. Eyraud, L. Eyraud, P. Gonnard, D. Noterman, and M. Troccaz: Proceedings of the Sixth IEEE International Symposium on Applications of Ferroelectrics, (IEEE, New York 1986).

DOI: 10.1109/isaf.1986.201219

[3] - M. Allahverdi, A. Hall, R. Brennan, M.E. Ebrahimi, N. Marandian Hagh, and A. Safari: J. Electroceram. Vol. 8 (2002), p.129.

DOI: 10.1023/a:1020503929340

[4] - A.J. Moulson, and J.M. Herbert: Electroceramics (Chapman and Hall, London, 1990).

[5] - H. Sung Lee, and Toshio Kimura: J. Am. Ceram. Soc. Vol. 81 (1998), p.3228.

[6] - C.V.R. Vasant Kumar, M. Sayer, and R. Pascual: Appl. Phys. Lett. Vol. 60 (1992), p.2207.

[7] - J.M. Xue, S. Ezhilvalavan, X.S. Gao, and J. Wang: Appl. Phys. Lett. Vol. 81 (2002), p.877.

[8] - S. Y. Kweon, S. K. Choi, S. J. Yeom, and J. S. Roh: Jpn. J. Appl. Phys. Vol. 40 (2001) 5850.

[9] - B.D. Cullity: Elements of X-Ray Diffraction (Addison-Wesley, Reading MA, 1978).

In order to see related information, you need to Login.