Effects of Layer Thickness and Incident Angle Variations on DBR Reflectivity


Article Preview

In this paper we discussed the relation between depth errors that happened in films growth and incidence angle variation on DBR reflectivity. We assume that there is 10% depth error in high and low index materials, and there are four plus one situations to be considered. Four are combinations of Hi +/- 10% error and Lo +/- 10% error, and no error. Our simulation results show that the depth error makes the reflective band shift and it almost doesn’t reduce reflectivity. The thickness error of +/- 10% in (Al0.4Ga0.6N/GaN) DBR structure (15 pairs) at 420nm was 42nm. A theoretical analysis using Transfer Matrix Mode with MATLAB software on the influence of layer thickness and incidence angle variation in vertical-cavity surface-emitting lasers with distributed Bragg reflectors (DBRs) on lasing wavelength is presented. It is shown that changing the thickness of the layers in the DBR mirror by only 10% is sufficient to produce shifts in the peak reflectance wavelength up to ± 20 nm (for a blue laser at 420nm). This could limit the precision of a desired wavelength, which is its reproducibility.



Edited by:

A.K. Arof and S.A. Hashim Ali




N. Mahmoud Ahmed et al., "Effects of Layer Thickness and Incident Angle Variations on DBR Reflectivity ", Materials Science Forum, Vol. 517, pp. 29-32, 2006

Online since:

June 2006





[1] G. P. Agrawal and N. K. Dutta: Semiconductor Laser 2nd Edu. (Van Nostrand Reinhold, New York, 1993).

[2] I. Akasaki and H. Amano, J. Electrochem. Soc., Vol. 141(1994), p.2266.

[3] K. Nam, K. Sang, Jpn. J. Appl. Phys. Vol. 43(1) (2004), p.182.

[4] F. Fedler, H. Klausing, Phys. Stat. Sol. C, Vol. 0(1) (2002), p.258.

[5] H. A. Macleod: Thin Film Optical Filters, 2nd Edu. (Bristol and Philadelphia. London 2000).

[6] H. M. Liddell: Computer-Aided Techniques for the Design of Multilayer Filter, 1st Adam (Hilger Ltd, Bristol, 1980).

[7] R. R. Freeman and R. H. Stulen, AT&T Technical Journal, November/December (1991), p.37.

[8] D. Windt, R. Hull and W. K. Waskiewicz, J. Appl. Phys., Vol. 71 (1992), p.2675.

[9] K. Popov, V. Dobrowolski, J. Tikhonravov, B. Sullivan, Appl. Optics, Vol. 36 (1997).

Fetching data from Crossref.
This may take some time to load.