Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods

Abstract:

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A new algorithm is proposed to determine the through-thickness residual stress gradient by X-ray Diffraction measurements on progressively thinned components. The procedure is based on a chemical or electrochemical attack of the component surface, which is then measured at each thinning stage. The simple algorithm provided for by a specific norm has been revised to take into account the X-ray absorption effects and the conditions of mechanical equilibrium of the component. The new procedure is illustrated for a typical case of study concerning a shot-peened metal component.

Info:

Periodical:

Materials Science Forum (Volumes 524-525)

Edited by:

W. Reimers and S. Quander

Pages:

25-30

DOI:

10.4028/www.scientific.net/MSF.524-525.25

Citation:

C. L. Azanza Ricardo et al., "Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods ", Materials Science Forum, Vols. 524-525, pp. 25-30, 2006

Online since:

September 2006

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Price:

$35.00

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